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A. H. Mahan, D. L. Williamson, B. P. Nelson and R. S. Crandall, “Characterization of Microvoids in Device-Quality Hydrogenated Amorphous Silicon by Small-Angle X-Ray Scattering and Infrared Measurements,” Physical Review B, Vol. 40, No. 17, 1989, pp. 12024-12027. doi:10.1103/PhysRevB.40.12024

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