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L. Borgese, A. Zacco, E. Bontempi, P. Colombi, R. Bertuzzi, E. Ferretti, S. Tenini and L. E. Depero, “Total Reflection of X-Ray Fluorescence (TXRF): A Mature Technique for Environmental Chemical Nanoscale Metrology,” Measurement Science and Technology, Vol. 20, No. 8, 2009, Article ID 084027. doi:10.1088/0957-0233/20/8/084027

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