Y. Badr, I. K. Battisha, A. M. S. El Nahrawy, B. Elouadi and M. Kamal, “Physical Study of Thin Film and Mo-nolithic Nanocomposites [SiO2:11P2O5:3Al2O3:(1.2)Er (1.2, 1.8 and 3)Yb] Prepared by Sol Gel Technique, Planar Waveguide and Co-operative Up-Conversion,” New Jour- nal of Glass and Ceramics, Vol. 1, No. 2, 2011, pp. 71-78. doi:10.4236/njgc.2011.12012

has been cited by the following article:

• TITLE: Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique

  AUTHORS: Inas Battisha, Amany El Nahrawy

  KEYWORDS: Sol-Gel; Nano-Structure SiO2P2O5 Thin Film; Scanning Electron Microscopy (SEM); XRD and FTIR

  JOURNAL NAME: New Journal of Glass and Ceramics, Vol.2 No.1, January 12, 2012

  ABSTRACT: A series of silica-phosphate nano-composites prepared as a host thin films Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique and doped with different concentrations of Er3+ ions have been synthesized using tetraesoxysilane TEOS, triethylphosphate TEP and erbium nitrate as precursor sources of silica, phosphorus and erbium oxides. The structural properties of pure silica-phosphate thin films and doped with different concentrations of Er3+ ions were studied, using x-ray diffraction (XRD) and Fourier Transform Infrared (FTIR). The morphology of silica-phosphate was characterized by Scanning electron microscope (SEM).