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Lity, S., Nahrendorf, S., Thum, T., Seidl, C. and Schaefer, I. (2018) 175 % Modeling for Product-Line Evolution of Domain Artifacts. Proceedings of the 12th International Workshop on Variability Modelling of Software-Intensive Systems, Madrid, 7-9 February 2018, 27-34.
https://doi.org/10.1145/3168365.3168369

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