Article citationsMore>>

Ganesh, P., Nagpure, D.C., Gupta, R.K. and Kukreja, L.M. (2015) Non-Destructive Micro-Structural Characterization of Metallic Specimens with a Portable X-Ray Diffraction Based Residual Stress Analyzer. Studies of Engineering Technology, 2, 22-32.
https://doi.org/10.11114/set.v2i1.795

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top