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Wrobel, P. and Czyzycki, M. (2013) Direct Deconvolution Approach for Depth Profiling of Element Concentrations in Multi-Layered Materials by Confocal Micro-Beam X-Ray Fluorescence Spectrometry. Talanta, 113, 62-67. https://doi.org/10.1016/j.talanta.2013.03.087

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