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Pianezzi, F., Reinhard, P., Chiril, A., Nishiwaki, S., Bissig, B., Buecheler, S. and Tiwari, A.N. (2013) Defect Formation in Cu(In,Ga)Se2 Thin Films Due to the Presence of Potassium during Growth by Low Temperature Co-Evaporation Process. Journal of Applied Physics, 114, Article ID: 194508.
https://doi.org/10.1063/1.4832781

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