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Xie, L., Feng, Q., Wen, Y., Wang, L., Jiang, C. and Lu, W. (2016) Surface Microstructure Characterization on Shot Peened (TiB + TiC)/Ti-6Al-4V by Rietveld Whole Pattern Fitting Method. J Mater Res, 31, 2291-2301. https://doi.org/10.1557/jmr.2016.256

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