Article citationsMore>>

Yeh, C.-T., Ker, M.-D. and Liang, Y.C. (2010) Optimization of Layout Style of ESD Protection Diode for Radio- Frequency Front-End and High-Speed I/O Interface Circuits. IEEE Transactions on Device and Materials Reliability, 10, 238-246.
http://dx.doi.org/10.1109/TDMR.2010.2043433

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top