Article citationsMore>>
Vieu, C., Carcenac, F., Pépin, A., Chen, Y., Mejias, M., Lebib, A., Manin-Ferlazzo, L., Couraud, L. and Launois, H. (2000) Electron Beam Lithography: Resolution Limits and Applications. Applied Surface Science, 164, 111-117.
http://dx.doi.org/10.1016/S0169-4332(00)00352-4
has been cited by the following article:
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TITLE:
Characterization of Nanorod Structure Using Spectroscopic Ellipsometry
AUTHORS:
N. E. J. Omaghali
KEYWORDS:
Spectroscopy, Ellipsometry, Nanorod, Resonance Modes
JOURNAL NAME:
Optics and Photonics Journal,
Vol.6 No.4,
April
21,
2016
ABSTRACT: We investigate the resonance modes of gold nanorods on an Indium tin
oxide (ITO) coated glass substrate using spectroscopic ellipsometry. The unit
cell of the structure investigated is composed of two gold nanorods with
differing lengths. In such a structure, we can excite the bright resoance and
the dark resonance modes. Numerical simulation of the gold nanorod on substrate
was performed with the bright resonance mode at 825.0 nm and the dark resonance
mode at 1107.1 nm respectively. Using spectroscopic ellipsometry we optically
characterize the fabricated gold nanostructure, with the bright resonance mode
at 700.0 nm and the dark resonance mode at 1350.0 nm respectively. The
experimental results from ellipsometry show a good agreement with the results
from simulation.
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