TITLE:
EMF of Hot Charge Carriers Arising at the p-n-Junction under the Influence of the Microwave Field and Light
AUTHORS:
Gafur Gulyamov, Muhammadjon Gulomkodirovich Dadamirzaev, Nosir Yusupjanovich Sharibayev, Ne’matjon Zokirov
KEYWORDS:
photocurrent lasing and recombination currents, hot electrons, the microwave field, light, p-n-junction
JOURNAL NAME:
Journal of Electromagnetic Analysis and Applications,
Vol.7 No.12,
December
10,
2015
ABSTRACT: It is shown that the increase in the current of an asymmetric p-n-junction, caused by perturbation of potential barrier height and increasing recombination current in a strong microwave field, is suppressed by light generated photo carriers, leading to the displacement of current-voltage characteristics of p-n-junction into the direction of smaller current values.