Article citationsMore>>

Baik, C.W., Lee, J., Choi, J. H., Jung, I., Choi, H.R., Jin, Y.W. and Kim, J.M. (2010) Structural Degradation Mechanism of Multiwalled Carbon Nanotubes in Electrically Treated Field Emission. Applied Physics Letters, 96, 023105. http://dx.doi.org/10.1063/1.3291108

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2025 Scientific Research Publishing Inc. All Rights Reserved.
Top