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N.T. Bagraev, W. Gehlhoff, L.E. Klyachkin, A.M. Malyarenko, V.A. Mashkov, V.V. Romanov, T.N. She-lykh, “ODMR of impurity centers embedded in silicon microcavities”, Physica E, Vol. 40, 2008, pp. 1627- 1629.

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