•   Home
  • Proceedings
  • International Conference on Information, Electronic and Comp...

International Conference on Information, Electronic and Computer Science (ICIECS 2010 E-BOOK)

Zibo,China,11.26-11.28,2010

ISBN: 978-1-935068-42-6 Scientific Research Publishing, USA

E-Book 2224pp Pub. Date: November 2010

Category: Computer Science & Communications

Price: $360

Title: Building Region Extraction Algorithm in Complex Scene Based on Morphological Scale-space and Hue Cluster Analysis
Source: International Conference on Information, Electronic and Computer Science (ICIECS 2010 E-BOOK) (pp 1463-1466)
Author(s): Miao Yang, The Department of Electronic Engineering of HuaiHai Institute of Technology, Lianyungang, 222005, China
Lirong Han, The Department of Computer Science of Ocean University, Qingdao, 266061, China
Chenglong Gong, The Department of Electronic Engineering of HuaiHai Institute of Technology, Lianyungang, 222005, China
Zhiqiang Wei, The Department of Computer Science of Ocean University, Qingdao, 266061, China
Abstract: In this paper, a new color image building region extraction method has been proposed aimed at the complex scene. It applies morphological sieves of large scale to obtain rough building contours, and a new segment optimization process to solve the problems of classical Hough transform. In addition, a method which can distinguish the building straight-line segments and the background straight-line segments effectively by analyzing the hue histogram cluster in the HSV color space is proposed. At last, extract the region of building according to the boundary features and the correlative geometric constraints. The experimental results show that the algorithm designed in this paper can extract building region more accurately on the basis of excluded background interference.
Proceedings by Subjects
Resources
Products
Contact us
book@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1243940697
Book Publishing WeChat
Follow SCIRP
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top