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International Conference on Information, Electronic and Computer Science (ICIECS 2010 E-BOOK)

Zibo,China,11.26-11.28,2010

ISBN: 978-1-935068-42-6 Scientific Research Publishing, USA

E-Book 2224pp Pub. Date: November 2010

Category: Computer Science & Communications

Price: $360

Title: The Design of Intermediate Test System of Quartz Crystal Based on the π-Network Zero Phase Method
Source: International Conference on Information, Electronic and Computer Science (ICIECS 2010 E-BOOK) (pp 1233-1236)
Author(s): Pengfei Zhao, School of Photoelectronic Information & Communication Engineering, Beijing Information Science & Technology ; University, Beijing 100192 China
Guili Liu, School of Photoelectronic Information & Communication Engineering, Beijing Information Science & Technology ; University, Beijing 100192 China
Yanlin Wang, School of Photoelectronic Information & Communication Engineering, Beijing Information Science & Technology ; University, Beijing 100192 China
Dong Li, School of Photoelectronic Information & Communication Engineering, Beijing Information Science & Technology ; University, Beijing 100192 China
Abstract: The intermediate test is a key link to control quality in the chain of quartz crystal producing. By researching the middle testing technology of crystal, using π-network zero phase measurement method, the electrical parameters of quartz crystal are tested, and the workstation display control module is designed. On this basis, the quartz crystal intermediate test system is designed. The system will ultimately realize the accurate test of the main electrical parameters of quartz crystals and the display of test results.
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