Author(s): |
XingZhu Wang, School of Electron and Information Engineering, Northeast Petroleum University, HeiLongJiang, DaQing, China, 163318 JiCheng Liu, School of Electron and Information Engineering, Northeast Petroleum University, HeiLongJiang, DaQing, China, 163318 YuBo Duan, School of Electron and Information Engineering, Northeast Petroleum University, HeiLongJiang, DaQing, China, 163318 |