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International Conference on Information, Electronic and Computer Science (ICIECS 2010 E-BOOK)

Zibo,China,11.26-11.28,2010

ISBN: 978-1-935068-42-6 Scientific Research Publishing, USA

E-Book 2224pp Pub. Date: November 2010

Category: Computer Science & Communications

Price: $360

Title: Discussion for the Reliability of SSR
Source: International Conference on Information, Electronic and Computer Science (ICIECS 2010 E-BOOK) (pp 580-582)
Author(s): Hudong Zhang, Institute of Microelectronics, School of Electronic and Information Engineering, South China University of Technology, Guangzhou 510640, China ;CEPREI, Guangzhou 510610, China
Xiaowen Zhang, CEPREI, Guangzhou 510610, China
Abstract: This paper analyzed the impact on the reliability of SSR from the opto-couplers and SCR, which are both the key devices that are easy to failure in solid state relays. Analysis shows the main factors of impacting the reliability of solid-state relay are heat stress and electrical stress. At last, this paper introduces the current research status of solid state relays reliability:Heat stress and heat management is the current research focus and the experiment and computer simulation are the two main methods.
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