Share This Article:

Phase Identification Using Series of Selected Area Diffraction Patterns and Energy Dispersive Spectrometry within TEM

Abstract Full-Text HTML XML Download Download as PDF (Size:4188KB) PP. 57-66
DOI: 10.4236/mr.2014.24008    7,521 Downloads   8,070 Views   Citations
Author(s)    Leave a comment

ABSTRACT

Transmission electron microscopy (TEM) is a very powerful technique for materials characteriza-tion, providing information relating to morphology, composition, and crystal structure. Selected area diffraction patterns (SADPs) are crystallographic data that can be obtained using a TEM in-strument. Conventional identification through SADP/TEM is tricky and tedious, thereby increasing the difficulty of phase identification. To establish a procedure for phase identification of known and unknown phases, in this study we examined two samples: one, a known phase, was Si with <100> alignment; the other, unknown, was the TixOy phase at the 96.4Au-3Ni-0.6Ti interlayer/ yttria-stabilized zirconia (YSZ) interface of a steel/96.4Au-3Ni-0.6Ti interlayer/YSZ joint. The procedures for phase identification of the known and unknown phases are described herein using a series of SADPs and energy dispersive spectrometry within TEM that would be useful for general researchers.

Conflicts of Interest

The authors declare no conflicts of interest.

Cite this paper

Lin, K. (2014) Phase Identification Using Series of Selected Area Diffraction Patterns and Energy Dispersive Spectrometry within TEM. Microscopy Research, 2, 57-66. doi: 10.4236/mr.2014.24008.

References

[1] [1] Edington, J.W. (1974) Monographs in Practical Electron Microscopy in Materials Science. N. V. Philips, England.
[2] [2] Williams, D.B. and Carter, C.B. (1996) Transmission Electron Microscopy. Plenum Press, New York, 267-287. http://dx.doi.org/10.1007/978-1-4757-2519-3
[3] [3] Fultz, B. and Howe, J. (2000) Transmission Electron Microscopy and Diffractometry of Materials. Springer, Berlin, 276-284.
[4] [4] Thomas, G. and Goringe, M.J. (1979) Transmission Electron Microscopy of Materials. John Wiley & Sons, New York.
[5] [5] Loretto, M.H. (1984) Electron Beam Analysis of Materials. Chapman & Hall, London. http://dx.doi.org/10.1007/978-94-009-5540-0
[6] [6] Lin, K.-L., Singh, M. and Asthana, R. (2014) Characterization of Yttria-Stabilized-Zirconia/Stainless Steel Joint Interfaces with Gold-Based Interlayers for Solid Oxide Fuel Cell Applications. Journal of the European Ceramic Society, 34, 355-372. http://dx.doi.org/10.1016/j.jeurceramsoc.2013.08.036

  
comments powered by Disqus

Copyright © 2018 by authors and Scientific Research Publishing Inc.

Creative Commons License

This work and the related PDF file are licensed under a Creative Commons Attribution 4.0 International License.