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H. Makino, S. Nakata, H. Suzuki, S. Mutoh, M. Miyama, T. Yoshimura, S. Iwade and Y. Matsuda, “Reexamination of SRAM Cell Write Margin Definitions in View of Predicting Distribution,” Transactions on Circuits and Systems II: Brief Express, Vol. 58, No. 4, 2011, pp. 230-234.
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Visit, “45 nm PTM HP Model: V2.1.”
http://www.eas.asu.edu/~ptm/
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