Journal of Applied Mathematics and Physics

Volume 6, Issue 1 (January 2018)

ISSN Print: 2327-4352   ISSN Online: 2327-4379

Google-based Impact Factor: 0.70  Citations  

Modelling and Calculation of Silicon Conduction Band Structure and Parameters with Arbitrary Uniaxial Stress

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DOI: 10.4236/jamp.2018.61018    1,022 Downloads   2,738 Views  Citations

ABSTRACT

Using the k·p theory, the coupling effect between the Δ1 and Δ2’ bands on the energy band structure of different energy valleys is studied. The analytical model of the energy-dispersion relationship applicable to uniaxial stress for arbitrary crystal plane and orientation as well as different energy valleys is established. For typical crystal orientations, the main parameters of energy band structure such as band edge level, splitting energy, density-of-state (DOS) effective mass and conductivity effective mass are calculated. The calculated results are in good agreement with the data reported in related literature. Finally, the relationship between the DOS effective mass, conductivity effective mass and the change of stress and orientation of different crystal planes is given. The proposed model and calculation results can provide a theoretical reference for the design of nano-electronic devices and TCAD simulation.

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Wang, G. , Yu, M. and Zhou, C. (2018) Modelling and Calculation of Silicon Conduction Band Structure and Parameters with Arbitrary Uniaxial Stress. Journal of Applied Mathematics and Physics, 6, 183-197. doi: 10.4236/jamp.2018.61018.

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