The Study of Relaxation Time in Test of 940 nm Semiconductor Laser ()
ABSTRACT
Conventional test of the peak wavelength of a laser used to be applied immediately after a device is injected current.
However, the results can not be considered as an accurate description to
temperature characteristic. This passage puts forward a concept of relaxation time in wavelength texts, mainly based on the experiment of 940 nm strain
quantum well laser, confirming that under constant current, wavelength will get
through a process of rising, and then, reach the limit. This process brings the effect on spectral
characteristics of a device which cannot be ignored and the accumulated heat in relaxation
time will gradually impact the emission wavelength of the laser, even crest
split to form bimodal phenomenon.
Share and Cite:
Li, J. , Li, J. , Liu, T. , Cui, B. , Deng, J. , Han, J. , He, L. and Lin, S. (2013) The Study of Relaxation Time in Test of 940 nm Semiconductor Laser.
Journal of Computer and Communications,
1, 46-49. doi:
10.4236/jcc.2013.17011.