Experimental Measurement of Minority Carriers Effective Lifetime in Silicon Solar Cell Using Open Circuit Voltage Decay under Magnetic Field in Transient Mode

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ISSN Print: 2151-481X
ISSN Online: 2151-4844
www.scirp.org/journal/sgre
E-mail: sgre@scirp.org

"Experimental Measurement of Minority Carriers Effective Lifetime in Silicon Solar Cell Using Open Circuit Voltage Decay under Magnetic Field in Transient Mode"
written by Alain Diasso, Raguilignaba Sam, Bernard Zouma, François Zougmoré,
published by Smart Grid and Renewable Energy, Vol.11 No.11, 2020

has been cited by the following article(s):

[1]	Theoretical and experimental studies of effective carriers lifetime: Magnetic effects
	2021

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