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[1]
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Hydrop enables droplet-based single-cell ATAC-seq and single-cell RNA-seq using dissolvable hydrogel beads
eLife,
2022
DOI:10.7554/eLife.73971
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|
|
|
[2]
|
Hydrop enables droplet-based single-cell ATAC-seq and single-cell RNA-seq using dissolvable hydrogel beads
eLife,
2022
DOI:10.7554/eLife.73971
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[3]
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Long-Term Stability Test on On-Wafer Measurement System in Frequency Ranges up to 325 GHz
IEEE Transactions on Instrumentation and Measurement,
2021
DOI:10.1109/TIM.2020.3047486
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[4]
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Automatic probing system with machine learning algorithm
2021 96th ARFTG Microwave Measurement Conference (ARFTG),
2021
DOI:10.1109/ARFTG49670.2021.9425064
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[5]
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An Improved Template-Matching-Based Pose Tracking Method for Planar Nanopositioning Stages Using Enhanced Correlation Coefficient
IEEE Sensors Journal,
2020
DOI:10.1109/JSEN.2020.2977370
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[6]
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Uncertainty Analysis Method Including Influence of Probe Alignment on On-Wafer Calibration Process
IEEE Transactions on Instrumentation and Measurement,
2019
DOI:10.1109/TIM.2019.2907733
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[7]
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Multi-target tracking for automated RF on-wafer probing based on template matching
2019 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS),
2019
DOI:10.1109/MARSS.2019.8860983
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[8]
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Demonstration of Improvement of Repeatability in Thru-Reflect-Line Calibration Using Precision Probing Technique
2018 48th European Microwave Conference (EuMC),
2018
DOI:10.23919/EuMC.2018.8541773
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[9]
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Realization of Accurate On-Wafer Measurement Using Precision Probing Technique at Millimeter-Wave Frequency
IEEE Transactions on Instrumentation and Measurement,
2018
DOI:10.1109/TIM.2018.2806058
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|
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[10]
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Accuracy Improvement of On-wafer Measurement at Millimeter-wave Frequency by a Full-automatic RF probe-tip Alignment Technique
2018 91st ARFTG Microwave Measurement Conference (ARFTG),
2018
DOI:10.1109/ARFTG.2018.8423825
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[11]
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RF wafer probing with improved contact repeatability using nanometer positioning
2016 87th ARFTG Microwave Measurement Conference (ARFTG),
2016
DOI:10.1109/ARFTG.2016.7501967
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[12]
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Simulation of probe misalignment effects during RF on-wafer probing
2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz),
2016
DOI:10.1109/IRMMW-THz.2016.7758851
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