Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film

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ISSN Print: 2162-531X
ISSN Online: 2162-5328
www.scirp.org/journal/ampc
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"Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film"
written by Golam Saklayen, Shahinul Islam, Ferdous Rahman, Abu Bakar Ismail,
published by Advances in Materials Physics and Chemistry, Vol.4 No.10, 2014

has been cited by the following article(s):

[1]	Preparation of ZnS by magnetron sputtering and its buffer effect on the preferential orientation growth of ITO thin film
	Micro & Nano Letters, 2018

[2]	PREFERENTIAL ORIENTATION GRWOTH OF ITO THIN FILM WITH ZNS BUFFER LAYER
	2018

[3]	Photo and electrical peculiarities of the nanostructured glass/ITO/AAO and glass/ITO/CdS systems
	Journal of Materials Science: Materials in Electronics, 2016

[4]	Porous silicon: A material of choice in solar energy harvesting
	2016

[1]	Preparation of ZnS by magnetron sputtering and its buffer effect on the preferential orientation growth of ITO thin film Micro & Nano Letters, 2018 DOI:10.1049/mnl.2017.0647

[2]	Characterization and Structural Property of Indium Tin Oxide Thin Films Advances in Materials Physics and Chemistry, 2017 DOI:10.4236/ampc.2017.72005

[3]	Photo and electrical peculiarities of the nanostructured glass/ITO/AAO and glass/ITO/CdS systems Journal of Materials Science: Materials in Electronics, 2016 DOI:10.1007/s10854-016-5053-9

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