Study and Analysis of Defect Amplification Index in Technology Variant Business Application Development through Fault Injection Patterns

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ISSN Print: 1945-3116
ISSN Online: 1945-3124
www.scirp.org/journal/jsea
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"Study and Analysis of Defect Amplification Index in Technology Variant Business Application Development through Fault Injection Patterns"
written by Paloli Mohammed Shareef, Midthe Vijayaraghavan Srinath, Subbiah Balasubramanian,
published by Journal of Software Engineering and Applications, Vol.3 No.4, 2010

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