Journal of Electromagnetic Analysis and Applications

ISSN Print: 1942-0730    ISSN Online: 1942-0749

Call For Papers

     

    Special Issue on Electromagnetic Compatibility and Electromagnetic Interferences

     

    Electromagnetic compatibility, or EMC means that a device is compatible with (i.e., no interference is caused by) its electromagnetic (EM) environment and it does not emit levels of EM energy that cause electromagnetic interference (EMI) in other devices in the vicinity. A medical device can be vulnerable to EMI if the levels of EM energy in its environment exceed the EM immunity (resistance) to which the device was designed and tested. The different forms of EM energy that can cause EMI are conducted, radiated, and electrostatic discharge (ESD). EMI problems with medical devices can be very complex, not only from the technical standpoint but also from the view of public health issues and solutions.

     

    In this special issue, we invite front-line researchers and authors to submit original research and review articles that explore electromagnetic compatibility and electromagnetic interferences. In this special issue, potential topics include, but are not limited to:

     

    • Electromagnetic compatibility testing
    • Electromagnetic compatibility control
    • Electromagnetic compatibility design
    • Coupling mechanisms
    • Types of interference
    • Electromagnetic compatibility standard

     

    Authors should read over the journal’s For Authors carefully before submission. Prospective authors should submit an electronic copy of their complete manuscript through the journal’s Paper Submission System.

     

    Please kindly specify the Special Issue” under your manuscript title. The research field “Special Issue - Electromagnetic Compatibility and Electromagnetic Interferencesshould be selected during your submission.

     

    Special Issue timetable:

     

    Submission Deadline

    June 21st, 2018

    Publication Date

    August 2018

     

    Guest Editor:

    Prof. Yuanzhang, Wuhan University, China 

     

    For further questions or inquiries

    Please contact Editorial Assistant at

    jemaa@scirp.org