Determination of Optimum Film Thickness and Composition of Cu(InAl)Se₂ Thin Films as anAbsorber for Solar Cell Applications

Balakrishnan Kavitha, Muthusamy Dhanam

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DOI: 10.4236/wjnse.2011.14017                

Abstract

Cu(InAl)Se₂ [CIAS] thin films have been prepared by chemical bath deposition [CBD] technique. X-ray diffraction [XRD] and Energy dispersive X-ray analysis [EDAX] spectra have been employed to confirm the structure and composition of the prepared films. The structural parameters have been estimated from XRD and EDAX spectra and their variation with film thickness and composition has been discussed in this paper in detail. From the discussion we enabled to find the optimum film thickness and composition of CIAS thin films for solar cell applications.

Keywords

CBD, XRD, EDAX, CIAS Thin Films

Conflicts of Interest

The authors declare no conflicts of interest.

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