Image Correction Method of Color Line-Scan System

Zhen-long Chen, Yu-tang Ye, Yun-cen Song, Ying Luo, Lin Liu, Juan-xiu Liu

School of Opto-electronic Information, University of Electronic Science and Technology of China, Chengdu 610054, China.

DOI: 10.4236/opj.2013.32B074                

Abstract

As the development of machine vision technology, the color line-scan system is widely applied in the on-line inspection. Due to the non-uniform gray scale and color distortion of the image acquired by the system, the image correction is needed to reduce the problem of image processing and the stability system. Based on reasons mentioned above, a method that using polynomial fitting to correct the image is presented to solve the problem in this paper. The method has been used in the automatic optical inspection of PCB, and has been proved to be effective. So this method will have a potential application to the development of the color line-scan machine vision system.

Keywords

Machine Vision; Automatic Optical Inspection (AOI); Color Line-scan System; White Balance; Flat-field Correction

Conflicts of Interest

The authors declare no conflicts of interest.

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