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Yield Evaluation of a Wheat Line with Combined Resistance to Russian Wheat Aphid and Stem Rust Race “Ug99” in Kenya

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DOI: 10.4236/ajps.2013.47181    3,510 Downloads   4,726 Views   Citations

ABSTRACT

InKenya, Russian wheat aphid (RWA) and stem rust race TTKS (“Ug99”) are the most devastating pests of wheat. Severe infestations by RWA result in yield losses of up to 90% while epidemics of “Ug99”can cause up to 100% loss. The two pests combined have seriously affected farmer incomes forcing them to rely heavily on pesticides and increasing the cost of production. This study sought to evaluate a wheat line that has been developed to be resistant to both RWA and “Ug99”by pyramiding two major resistance genes. Three varieties were used in this study: Kwale, a Kenyan high yielding commercial variety but susceptible to both RWA and “Ug99”; Cook, an Australian variety carrying stem rust resistance gene Sr36 conferring immunity to “Ug99”; and KRWA9”, a Kenyan line resistant to RWA but with poor agronomic attributes. The F1 of the double cross (DC F1) was obtained by crossing the F1 of Kwale × Cook and the F1 of Kwale × KRWA9”. The DC F1 population was subjected to sequential screening for both RWA and “Ug99”resistance. The surviving DC F1 progenies were left to self pollinate in the field to obtain the DC F2. The DC F2 progenies were sequentially screened against RWA and “Ug99”to obtain a resistant population to both RWA and “Ug99”. The yield and yield components of the new resistant line were compared with the three parents. Results showed that the DC F2:3 had higher yields than the three parents based on 1000 kernel weight, weight of kernel per spike, and the actual yield in tons/ha, indicating that the genes were successfully introgressed. It is concluded that though races with virulence for Sr36 have been reported, the gene provides immunity to race “Ug99”and can be used as a component for “Ug99”resistance breeding together with other Sr genes.

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F. Amulaka, J. Maling’a, R. Pathak, M. Cakir and R. Mulwa, "Yield Evaluation of a Wheat Line with Combined Resistance to Russian Wheat Aphid and Stem Rust Race “Ug99” in Kenya," American Journal of Plant Sciences, Vol. 4 No. 7, 2013, pp. 1494-1499. doi: 10.4236/ajps.2013.47181.

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