Optical Methods in Orientation of High-Purity Germanium Crystal

Guojian Wang, Yongchen Sun, Yutong Guan, Dongming Mei, Gang Yang, Angela Alanson Chiller, Bruce Gray

Department of Chemistry, University of South Dakota, Vermillion, USA..
Department of Physics, University of South Dakota, Vermillion, USA.

DOI: 10.4236/jcpt.2013.32009                

Abstract

Two optical methods, namely crystal facet reflection and etching pits reflection, were used to orient <100> and <111> high-purity germanium crystals. The X-ray diffraction patterns of three slices that were cut from the oriented <100> and <111> crystals were measured by X-ray diffraction. The experimental errors of crystal facet reflection method and etching pits reflection method are in the range of 0.05° - 0.12°. The crystal facet reflection method and etching pits reflection method are extremely simple and cheap and their accuracies are acceptable for characterizing high purity detector-grade germanium crystals.

Keywords

Reflection Method; High-Purity Germanium Crystal

Conflicts of Interest

The authors declare no conflicts of interest.

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