Scanning Head for the Apertureless near Field Optical Microscope

Abstract

The design and characterization of a tip control unit for an apertureless scanning near field optical microscope (ASNOM) is reported. To make the instrument operation easier, the cantilever control parts (piezo excitation of the cantilever vibration for the dynamic mode feedback and the parts necessary for the optical lever scheme of the vibration control) were placed in a separate detachable assembly. To suppress the influence of vibrations of the setup, the assembly was made lightweight. Good optical access to the ASNOM tip from various directions is provided in the system. High long-term mechanical stability of the system (~50 nm lateral drift in 18 hours) as well as low sensitivity to seismic vibrations (~400 pm RMS) is demonstrated. It is shown that external sound is not a main source of noise in the topography image (~200 pm RMS). The light field distribution (with its amplitude and phase) around the ASNOM tip was acquired by scanning the focal spot around the tip, and a high optical quality of the system is demonstrated.

Share and Cite:

D. Kazantsev and H. Ryssel, "Scanning Head for the Apertureless near Field Optical Microscope," Modern Instrumentation, Vol. 2 No. 2, 2013, pp. 33-40. doi: 10.4236/mi.2013.22006.

Conflicts of Interest

The authors declare no conflicts of interest.

References

[1] F. Zenhausern, M. P. O’Boyle and H. K. Wickramasinghe, “Apertureless Near-Field Optical Microscope,” Applied Physics Letters, Vol. 65, 1994, No. 13, pp. 1623-1625. doi:10.1063/1.112931
[2] E. Betzig, M. Isaacson and A. Lewis, “Collection Mode Near-Field Scanning Optical Microscopy,” Applied Physics Letters, Vol. 51, No. 25, 1987, pp. 2088-2090. doi:10.1063/1.98956
[3] G. Binnig, C. F. Quate and C. Gerber, “Atomic Force Microscope,” Physical Review Letters, Vol. 56, No. 9, 1986, pp. 930-933. doi:10.1103/PhysRevLett.56.930
[4] U. C. Fischer and D. W. Pohl, “Observation of Single-Particle Plasmons by Near-Field Optical Microscopy,” Physical Review Letters, Vol. 62, No. 4, 1989, pp. 458-461. doi:10.1103/PhysRevLett.62.458
[5] F. Zenhausern, Y. Martin and H. K. Wickramasinghe, “Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution,” Science, Vol. 269, No. 5227, 1995, pp. 1083-1085. doi:10.1126/science.269.5227.1083
[6] A. Cvitkovic, N. Ocelic, J. Aizpurua, R. Guckenberger and R. Hillenbrand, “Infrared Imaging of Single Nanoparticles via Strong Field Enhancement in a Scanning Nanogap,” Physical Review Letters, Vol. 97, No. 6, 2006, Article ID: 060801. doi:10.1103/PhysRevLett.97.060801
[7] M. Brehm, T. Taubner, R. Hillenbrand and F. Keilmann, “Infrared Spectroscopic Mapping of Single Nanoparticles and Viruses at Nanoscale Resolution,” Nano Letters, Vol. 6, No. 7, 2006, pp. 1307-1310. doi:10.1021/nl0610836
[8] Y. Martin, F. Zenhausern and H. K. Wickramasinghe, “Scattering Spectroscopy of Molecules at Nanometer Resolution,” Applied Physics Letters, Vol. 68, No. 18, 1996, pp. 2475-2477. doi:10.1063/1.115825
[9] R. St?ckle, Y. Suh, V. Deckert and R. Zenobi, “Nanoscale Chemical Analysis by Tip-Enhanced Raman Spectroscopy,” Chemical Physics Letters, Vol. 318, No. 1-3, 2000, pp. 131-136. doi:10.1016/S0009-2614(99)01451-7
[10] L. T. Nieman, G. M. Krampert and R. E. Martinez, “An Apertureless Near-Field Scanning Optical Microscope and Its Application to Surface-Enhanced Raman Spectroscopy and Multiphoton Fluorescence Imaging,” Review of Scientific Instruments, Vol. 72 No. 3, 2001, pp. 1691-1699. doi:10.1063/1.1347975
[11] B. Pettinger, B. Ren, G. Picardi, R. Schuster and G. Ertl, “Nanoscale Probing of Adsorbed Species by Tip-Enhanced Raman Spectroscopy,” Physical Review Letters, Vol. 92, No. 9, 2004, Article ID: 096101. doi:10.1103/PhysRevLett.92.096101
[12] J. S. Batchelder and M. A. Taubenblatt, “Interferometric Detection of Forward Scattered Light from Small Particles,” Applied Physics Letters, Vol. 55, No. 3, 1989, pp. 215-217. doi:10.1063/1.102268
[13] A. Bek, R. Vogelgesang and K. Kern, “Apertureless Scanning near Field Optical Microscope with Sub-10 nm Resolution,” Review of Scientific Instruments, Vol. 77, No. 4, 2006, Article ID: 43703. doi:10.1063/1.2190211
[14] R. Hillenbrand and F. Keilmann, “Complex Optical Constants on a Subwavelength Scale,” Physical Review Letters, Vol. 85, No. 14, 2000, pp. 3029-3032. doi:10.1103/PhysRevLett.85.3029
[15] N. Ocelic, A. Huber and R. Hillenbrand, “Pseudoheterodyne Detection for Background-Free Near-Field Spectroscopy,” Applied Physics Letters, Vol. 89, No. 10, 2006, Article ID: 101124. doi:10.1063/1.2348781
[16] G. Wurtz, R. Bachelot and P. Royer, “A Reflection-Mode Apertureless Scanning Near-Field Optical Microscope Developed from a Commercial Scanning Probe Microscope,” Review of Scientific Instruments, Vol. 69, No. 4, 1998, pp. 1735-1743. doi:10.1063/1.1148834
[17] R. Bachelot, P. Gleyzes and A. C. Boccara, “Reflection-Mode Scanning Near-Field Optical Microscopy Using an Apertureless Metallic Tip,” Applied Optics, Vol. 36, No. 10, 1997, pp. 2160-2170. doi:10.1364/AO.36.002160
[18] Neaspec GmbH. http://www.neaspec.com
[19] A. Lahrech, R. Bachelot, P. Gleyzes and A. C. Boccara, “Infrared Reflection-Mode Near-Field Microscopy Using an Apertureless Probe with a Resolution of λ/600,” Optics Letters, Vol. 21, No. 17, 1996, pp. 1315-1317. doi:10.1364/OL.21.001315
[20] M. Labardi, S. Patanè and M. Allegrini, “Artifact-Free Near-Field Optical Imaging by Apertureless Microscopy,” Applied Physics Letters, Vol. 77, No. 5, 2000, pp. 621-623. doi:10.1063/1.127064
[21] O. J. F. Martin and C. Girard, “Controlling and Tuning Strong Optical Field Gradients at a Local Probe Microscope Tip Apex,” Applied Physics Letters, Vol. 70, No. 6, 1997, pp. 705-707. doi:10.1063/1.118245
[22] NT-MDT (Moscow) NTegra SNOM System. http://www.ntmdt.com/device/ntegra-spectra
[23] JPK GmbH, TAO SNOM System. http://www.jpk.com/tao.download.61f23e409a2a8af9654595a415025092.pdf
[24] U. D. Schwarz, H. H?lscher and R. Wiesendanger, “Atomic Resolution in Scanning Force Microscopy: Concepts, Requirements, Contrast Mechanisms, and Image Interpretation,” Physical Review B, Vol. 62, No. 19, 2000, pp. 13089-13097. doi:10.1103/PhysRevB.62.13089
[25] F. J. Giessibl, “Advances in Atomic Force Microscopy,” Reviews of Modern Physics, Vol. 75, No. 3, 2003, pp. 949-983. doi:10.1103/RevModPhys.75.949
[26] F. Keilmann and R. Hillenbrand, German Patent DE10-2006002461A1.
[27] G. Meyer and N. M. Amer, “Novel Optical Approach to Atomic Force Microscopy,” Applied Physics Letters, Vol. 53, No. 12, 1988, pp. 1045-1047. doi:10.1063/1.100061
[28] S. Kitamura and M. Iwatsuki, “Observation of 7 × 7 Reconstructed Structure on the Silicon (111) Surface Using Ultrahigh Vacuum Noncontact Atomic Force Microscopy,” Japanese Journal of Applied Physics, Vol. 34, Part 2, No. 1B, 1995, pp. L145-L148. doi:10.1143/JJAP.34.L145
[29] US Patent RE37, 299E.
[30] C. Putman, B. Grooth, N. Hulst and J. Greve, “A Detailed Analysis of the Optical Beam Deflection Technique for Use in Atomic Force Microscopy,” Journal of Applied Physics, Vol. 72, No. 1, 1992, pp. 6-12. doi:10.1063/1.352149
[31] G. Merritt, E. Monson, E. Betzig and R. Kopelman, “A Compact Fluorescence and Polarization Near-Field Scanning Optical Microscope,” Review of Scientific Instruments, Vol. 69, No. 7, 1998, pp. 2685-2690. doi:10.1063/1.1148999
[32] P. G. Gucciardi, M. Labardi, S. Gennai, F. Lazzeri and M. Allegrini, “Versatile Scanning Near-Field Optical Microscope for Material Science Applications,” Review of Scientific Instruments, Vol. 68, No. 8, 1997, pp. 3088-3092. doi:10.1063/1.1148246
[33] A. Naber, H.-J. Maas, K. Razavi and U. C. Fischer, “Dynamic Force Distance Control Suited to Various Probes for Scanning Near-Field Optical Microscopy,” Review of Scientific Instruments, Vol. 70, No. 10, 1999, pp. 3955-3961. doi:10.1063/1.1150019
[34] Nanosurfr Mobile S Atomic Force Microscope.
[35] M. Tortonese, R. C. Barrett and C. F. Quate, “Atomic Resolution with an Atomic Force Microscope Using Piezoresistive Detection,” Applied Physics Letters, Vol. 62, No. 8, 1993, pp. 834-836. doi:10.1063/1.108593

Copyright © 2024 by authors and Scientific Research Publishing Inc.

Creative Commons License

This work and the related PDF file are licensed under a Creative Commons Attribution 4.0 International License.