Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique

Inas Battisha, Amany El Nahrawy

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DOI: 10.4236/njgc.2012.21004                

Abstract

A series of silica-phosphate nano-composites prepared as a host thin films Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique and doped with different concentrations of Er³⁺ ions have been synthesized using tetraesoxysilane TEOS, triethylphosphate TEP and erbium nitrate as precursor sources of silica, phosphorus and erbium oxides. The structural properties of pure silica-phosphate thin films and doped with different concentrations of Er³⁺ ions were studied, using x-ray diffraction (XRD) and Fourier Transform Infrared (FTIR). The morphology of silica-phosphate was characterized by Scanning electron microscope (SEM).

Keywords

Sol-Gel; Nano-Structure SiO₂P₂O₅ Thin Film; Scanning Electron Microscopy (SEM); XRD and FTIR

Conflicts of Interest

The authors declare no conflicts of interest.

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