Department of Engineering-Electronics Branch, Shahrekord University, Shahrekord, Iran
Department of Engineering-Electronics Branch, Shahrekord University, Shahrekord, Iran
Copyright © 2018 Nooshien Laderian, Arash Daghighi et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
Laderian, N. and Daghighi, A. (2018) Investigation and Comparison of the DIBL Parameter and Thermal Effects of SOD Transistors and SOI Transistors and Improving Them with the Change of Their BOX Thicknesses.
Journal of Electronics Cooling and Thermal Control,
8, 19-30. doi:
10.4236/jectc.2018.82002.