Journal of Modern Physics
Vol.9 No.4(2018), Paper ID 83153, 11 pages
DOI:10.4236/jmp.2018.94041
An Experiment to Improve the Model of Lumped Element Circuit
Tsao Chang
Shanghai Science and Technology Senior University, Shanghai, China
Copyright © 2018 Tsao Chang et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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