Journal of Materials Science and Chemical Engineering
Vol.5 No.1(2017), Paper ID 73250, 7
pages
DOI:10.4236/msce.2017.51002
Resistive Switching in Stabilized Zirconia Films Studied by Conductive Atomic Force Microscopy
Dmitry Filatov, Dmitry Antonov, Ivan Antonov, Alexander Kasatkin, Oleg Gorshkov
Research and Educational Center for Physics of Solid State Nanostructures, Lobachevsky State University of Nizhny Novgorod, Nizhny Novgorod, Russia
Research and Educational Center for Physics of Solid State Nanostructures, Lobachevsky State University of Nizhny Novgorod, Nizhny Novgorod, Russia
Research and Educational Center for Physics of Solid State Nanostructures, Lobachevsky State University of Nizhny Novgorod, Nizhny Novgorod, Russia
Research and Educational Center for Physics of Solid State Nanostructures, Lobachevsky State University of Nizhny Novgorod, Nizhny Novgorod, Russia
Research and Educational Center for Physics of Solid State Nanostructures, Lobachevsky State University of Nizhny Novgorod, Nizhny Novgorod, Russia
Copyright © 2017 Dmitry Filatov, Dmitry Antonov, Ivan Antonov, Alexander Kasatkin, Oleg Gorshkov et al. This is
an open access article distributed under the Creative Commons Attribution
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medium, provided the original work is properly cited.
How to Cite this Article
Filatov, D. , Antonov, D. , Antonov, I. , Kasatkin, A. and Gorshkov, O. (2017) Resistive Switching in Stabilized Zirconia Films Studied by Conductive Atomic Force Microscopy.
Journal of Materials Science and Chemical Engineering,
5, 8-14. doi:
10.4236/msce.2017.51002.