Optics and Photonics Journal

Vol.6 No.10(2016), Paper ID 71278, 8 pages

DOI:10.4236/opj.2016.610026

 

Unified Coverage Methodology for SoC Post-Silicon Validation

 

Semih Aslan, G. Karuna Ranganathapura Chandrai, Vittal Siddaiah

 

Ingram School of Engineering, Electrical Engineering, Texas State University, San Marcos, TX, USA
Ingram School of Engineering, Electrical Engineering, Texas State University, San Marcos, TX, USA
Intel Corporation, Austin, TX, USA

 

Copyright © 2016 Semih Aslan, G. Karuna Ranganathapura Chandrai, Vittal Siddaiah et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


Aslan, S. , Chandrai, G. and Siddaiah, V. (2016) Unified Coverage Methodology for SoC Post-Silicon Validation. Optics and Photonics Journal, 6, 261-268. doi: 10.4236/opj.2016.610026.

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