Departement de Physique Appliquée, Université de Gaston Berger, Saint Louis, Sénégal
Laboratoire de Chimie et de Physique des Matériaux (LCPM), Université Assane Seck de Ziguinchor, Ziguinchor, Sénégal
Laboratoire de Chimie et de Physique des Matériaux (LCPM), Université Assane Seck de Ziguinchor, Ziguinchor, Sénégal
Aix Marseille Université, Domaine Universitaire de Saint Jérôme, Marseille, France
Copyright © 2016 Abdou Karim Diallo, Abdoul Kadri Diallo, Diouma Kobor, Marcel Pasquinelli et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
Karim Diallo, A. , Kadri Diallo, A. , Kobor, D. and Pasquinelli, M. (2016) Electrical Instability in Pentacene Transistors with Mylar and PMMA/Mylar Gate Dielectrics Transferred by Lamination Process.
Journal of Applied Mathematics and Physics,
4, 1202-1209. doi:
10.4236/jamp.2016.47125.