Materials Sciences and Applications
Vol.7 No.6(2016), Paper ID 67669, 12
pages
DOI:10.4236/msa.2016.76030
Electrical Homo-Junction Delineation Techniques: A Comparative Study
Nicolas Vivet, Mélanie Diogo, Amandine Aubert, Tony Moinet, Fabien Allanic, Raphael Perdreau, Jean-Paul Rebrassé
Failure and Technology Analysis Laboratory (LAT), ST Microelectronics, Tours, France
Failure and Technology Analysis Laboratory (LAT), ST Microelectronics, Tours, France
Failure and Technology Analysis Laboratory (LAT), ST Microelectronics, Tours, France
Failure and Technology Analysis Laboratory (LAT), ST Microelectronics, Tours, France
Failure and Technology Analysis Laboratory (LAT), ST Microelectronics, Tours, France
Failure and Technology Analysis Laboratory (LAT), ST Microelectronics, Tours, France
Failure and Technology Analysis Laboratory (LAT), ST Microelectronics, Tours, France
Copyright © 2016 Nicolas Vivet, Mélanie Diogo, Amandine Aubert, Tony Moinet, Fabien Allanic, Raphael Perdreau, Jean-Paul Rebrassé et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
Vivet, N. , Diogo, M. , Aubert, A. , Moinet, T. , Allanic, F. , Perdreau, R. and Rebrassé, J. (2016) Electrical Homo-Junction Delineation Techniques: A Comparative Study.
Materials Sciences and Applications,
7, 326-347. doi:
10.4236/msa.2016.76030.