World Journal of Engineering and Technology

Vol.4 No.2(2016), Paper ID 66328, 6 pages

DOI:10.4236/wjet.2016.42019

 

Accelerated Testing of Devices on Durability and Fatigue Failure

 

Archil Prangishvili, Oleg Namicheishvili

 

Department of Computer Engineering, Georgian Technical University, Tbilisi, Georgia
Department of Computer Engineering, Georgian Technical University, Tbilisi, Georgia

 

Copyright © 2016 Archil Prangishvili, Oleg Namicheishvili et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article

Prangishvili, A. and Namicheishvili, O. (2016) Accelerated Testing of Devices on Durability and Fatigue Failure. World Journal of Engineering and Technology, 4, 200-205. doi: 10.4236/wjet.2016.42019.
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