JCPT> Vol.1 No.2, July 2011

 

Copyright © 2011 V.I Talanin, I.E Talanin, N.Ph Ustimenko et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

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V. Talanin, I. Talanin and N. Ustimenko, "A New Method for Research of Grown-In Microdefects in Dislocation-Free Silicon Single Crystals," Journal of Crystallization Process and Technology, Vol. 1 No. 2, 2011, pp. 13-17. doi: 10.4236/jcpt.2011.12003.

 

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