Journal of Materials Science and Chemical Engineering
Vol.4 No.1(2016), Paper ID 62598, 6
pages
DOI:10.4236/msce.2016.41007
Characterization of Silver Nanoparticles Thin Films with Various Thicknesses by AFM
Ling Li, Ling Li, Weidong Chen, Jie Zheng, Linwen Wang, Yan Chen
College of Physics and Electronic Engineering, Sichuan Normal University, Chengdu 610101, China
College of Physics and Electronic Engineering, Sichuan Normal University, Chengdu 610101, China
College of Physics and Electronic Engineering, Sichuan Normal University, Chengdu 610101, China
College of Physics and Electronic Engineering, Sichuan Normal University, Chengdu 610101, China
College of Physics and Electronic Engineering, Sichuan Normal University, Chengdu 610101, China
College of Physics and Electronic Engineering, Sichuan Normal University, Chengdu 610101, China
Copyright © 2016 Ling Li, Ling Li, Weidong Chen, Jie Zheng, Linwen Wang, Yan Chen et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
Li, L. , Li, L. , Chen, W. , Zheng, J. , Wang, L. and Chen, Y. (2016) Characterization of Silver Nanoparticles Thin Films with Various Thicknesses by AFM.
Journal of Materials Science and Chemical Engineering,
4, 34-39. doi:
10.4236/msce.2016.41007.