Journal of Crystallization Process and Technology

Vol.5 No.4(2015), Paper ID 60117, 9 pages

DOI:10.4236/jcpt.2015.54007

 

Enhanced Ferroelectric Properties of Multilayer SBT-BTN Thin Films for NVRAM Applications

 

Oleksandr Khorkhordin, Chia-Pin Yeh, Bodo Kalkofen, Edmund Burte

 

Institute of Micro and Sensor Systems, Otto von Guericke University, Magdeburg, Germany
Institute of Micro and Sensor Systems, Otto von Guericke University, Magdeburg, Germany
Institute of Micro and Sensor Systems, Otto von Guericke University, Magdeburg, Germany
Institute of Micro and Sensor Systems, Otto von Guericke University, Magdeburg, Germany

 

Copyright © 2015 Oleksandr Khorkhordin, Chia-Pin Yeh, Bodo Kalkofen, Edmund Burte et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


Khorkhordin, O. , Yeh, C. , Kalkofen, B. and Burte, E. (2015) Enhanced Ferroelectric Properties of Multilayer SBT-BTN Thin Films for NVRAM Applications. Journal of Crystallization Process and Technology, 5, 49-57. doi: 10.4236/jcpt.2015.54007.

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