Optics and Photonics Journal

Vol.5 No.4(2015), Paper ID 55457, 6 pages

DOI:10.4236/opj.2015.54011

 

Correlation between Coating Adhesion and Damage Threshold: Simple Method of Reliability Assessment for Optoelectronic Applications

 

Jongwoo Park, Dong-Soo Shin

 

Samsung Electronics, System LSI Business, Yongin, Korea
Department of Applied Physics, Hanyang University, ERICA Campus, Ansan, Korea

 

Copyright © 2015 Jongwoo Park, Dong-Soo Shin et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


Park, J. and Shin, D. (2015) Correlation between Coating Adhesion and Damage Threshold: Simple Method of Reliability Assessment for Optoelectronic Applications. Optics and Photonics Journal, 5, 119-124. doi: 10.4236/opj.2015.54011.

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