Advances in Materials Physics and Chemistry
Vol.4 No.10(2014), Paper ID 50762, 9
pages
DOI:10.4236/ampc.2014.410023
Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film
Golam Saklayen, Shahinul Islam, Ferdous Rahman, Abu Bakar Ismail
Department of Applied Physics and Electronic Engineering, Rajshahi University, Rajshahi,
Bangladesh
Department of Applied Physics and Electronic Engineering, Rajshahi University, Rajshahi,
Bangladesh
Department of Applied Physics and Electronic Engineering, Rajshahi University, Rajshahi,
Bangladesh
Department of Applied Physics and Electronic Engineering, Rajshahi University, Rajshahi,
Bangladesh
Copyright © 2014 Golam Saklayen, Shahinul Islam, Ferdous Rahman, Abu Bakar Ismail et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
Saklayen, G. , Islam, S. , Rahman, F. and Ismail, A. (2014) Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film.
Advances in Materials Physics and Chemistry,
4, 194-202. doi:
10.4236/ampc.2014.410023.