Research & Development Department, OHT Incorporation, Fukuyama, Japan
Research & Development Department, OHT Incorporation, Fukuyama, Japan
Department of Electrical Systems and Mathematical Engineering, Faculty of Engineering, Hiroshima University, Hiroshima, Japan
Department of Electrical Systems and Mathematical Engineering, Faculty of Engineering, Hiroshima University, Hiroshima, Japan
Copyright © 2014 Hapu Arachchilage Abeysundara, Hiroshi Hamori, Takeshi Matsui, Masatoshi Sakawa et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
Abeysundara, H. , Hamori, H. , Matsui, T. and Sakawa, M. (2014) Defects Detection of TFT Lines of Flat Panel Displays Using an Evolutionary Optimized Recurrent Neural Network.
American Journal of Operations Research,
4, 113-123. doi:
10.4236/ajor.2014.43011.