American Journal of Plant Sciences

Vol.5 No.9(2014), Paper ID 44713, 11 pages

DOI:10.4236/ajps.2014.59142

 

Characterization of Short-Term Stress Applied to the Root System by Electrical Impedance Measurement in the First Leaf of Corn (Zea mays L.) and Pumpkin (Cucurbita maxima L.)

 

Saïd Laarabi

 

Department of Biology, Laboratory of Plant Physiology, Uni-versity Mohammed V-Agdal, Faculty of Sciences, Rabat, Morocco

 

Copyright © 2014 Saïd Laarabi et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article

Laarabi, S. (2014) Characterization of Short-Term Stress Applied to the Root System by Electrical Impedance Measurement in the First Leaf of Corn (Zea mays L.) and Pumpkin (Cucurbita maxima L.). American Journal of Plant Sciences, 5, 1285-1295. doi: 10.4236/ajps.2014.59142.
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