Engineering

Vol.5 No.10BB(2013), Paper ID 42903, 4 pages

DOI:10.4236/eng.2013.510B118

 

New Approach for Limited-Angle Problems in Electron Microscope Based on Compressed Sensing

 

Marc Vila Oliva, Hamed Hamid Muhammed

 

Royal Institute of Technology KTH, School of Technology and Health STH Alfred Nobels, Huddinge, Sweden
Royal Institute of Technology KTH, School of Technology and Health STH Alfred Nobels, Huddinge, Sweden

 

Copyright © 2013 Marc Vila Oliva, Hamed Hamid Muhammed et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


Oliva, M. and Muhammed, H. (2013) New Approach for Limited-Angle Problems in Electron Microscope Based on Compressed Sensing. Engineering, 5, 575-578. doi: 10.4236/eng.2013.510B118.

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