Journal of Computer and Communications
Vol.1 No.7(2013), Paper ID 40283, 4
pages
DOI:10.4236/jcc.2013.17011
The Study of Relaxation Time in Test of 940 nm Semiconductor Laser
Jiachun Li, Jianjun Li, Tao Liu, Bifeng Cui, Jun Deng, Jun Han, Linjie He, Shengjie Lin
Key Laboratory of Opto-Electronics Technology, Beijing University of Technology, Beijing, China.
Key Laboratory of Opto-Electronics Technology, Beijing University of Technology, Beijing, China.
Key Laboratory of Opto-Electronics Technology, Beijing University of Technology, Beijing, China.
Key Laboratory of Opto-Electronics Technology, Beijing University of Technology, Beijing, China.
Key Laboratory of Opto-Electronics Technology, Beijing University of Technology, Beijing, China.
Key Laboratory of Opto-Electronics Technology, Beijing University of Technology, Beijing, China.
Key Laboratory of Opto-Electronics Technology, Beijing University of Technology, Beijing, China.
Key Laboratory of Opto-Electronics Technology, Beijing University of Technology, Beijing, China.
Copyright © 2013 Jiachun Li, Jianjun Li, Tao Liu, Bifeng Cui, Jun Deng, Jun Han, Linjie He, Shengjie Lin et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
Li, J. , Li, J. , Liu, T. , Cui, B. , Deng, J. , Han, J. , He, L. and Lin, S. (2013) The Study of Relaxation Time in Test of 940 nm Semiconductor Laser.
Journal of Computer and Communications,
1, 46-49. doi:
10.4236/jcc.2013.17011.