Journal of Computer and Communications
Vol.1 No.6(2013), Paper ID 39991, 5
pages
DOI:10.4236/jcc.2013.16005
Limitations of On-Wafer Calibration and De-Embedding Methods in the Sub-THz Range
Manuel Potereau, Christian Raya, Magali De Matos, Sébastien Fregonese, Arnaud Curutchet, Min Zhang, Bertrand Ardouin, Thomas Zimmer
IMS Laboratory, University of Bordeaux 1, Talence, France;
XMOD Technologies, Bordeaux, France
IMS Laboratory, University of Bordeaux 1, Talence, France
IMS Laboratory, University of Bordeaux 1, Talence, France
IMS Laboratory, University of Bordeaux 1, Talence, France
XMOD Technologies, Bordeaux, France
XMOD Technologies, Bordeaux, France
1IMS Laboratory, University of Bordeaux 1, Talence, France; 2XMOD Technologies, Bordeaux, France
Copyright © 2013 Manuel Potereau, Christian Raya, Magali De Matos, Sébastien Fregonese, Arnaud Curutchet, Min Zhang, Bertrand Ardouin, Thomas Zimmer et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
Potereau, M. , Raya, C. , Matos, M. , Fregonese, S. , Curutchet, A. , Zhang, M. , Ardouin, B. and Zimmer, T. (2013) Limitations of On-Wafer Calibration and De-Embedding Methods in the Sub-THz Range.
Journal of Computer and Communications,
1, 25-29. doi:
10.4236/jcc.2013.16005.