International Journal of Geosciences

Vol.4 No.9(2013), Paper ID 39479, 9 pages

DOI:10.4236/ijg.2013.49117

 

Spectral Model for Soybean Yield Estimate Using MODIS/EVI Data

 

Anibal Gusso, Jorge Ricardo Ducati, Mauricio Roberto Veronez, Damien Arvor, Luiz Gonzaga da Silveira

 

Environmental Engineering, UNISINOS, S?o Leopoldo, Brazil
Remote Sensing Center and Astronomy Department, UFRGS, Porto Alegre, Brazil
Graduate Program in Geology, UNISINOS, S?o Leopoldo, Brazil
Institut de Recherche Pour le Développement (IRD), Montpellier, France
Graduate Program in Applied Computing, UNISINOS, Sao Leopoldo, Brazil

 

Copyright © 2013 Anibal Gusso, Jorge Ricardo Ducati, Mauricio Roberto Veronez, Damien Arvor, Luiz Gonzaga da Silveira et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


A. Gusso, J. Ducati, M. Veronez, D. Arvor and L. Silveira, "Spectral Model for Soybean Yield Estimate Using MODIS/EVI Data," International Journal of Geosciences, Vol. 4 No. 9, 2013, pp. 1233-1241. doi: 10.4236/ijg.2013.49117.

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